JASCO | Specular Reflectance
1. SLM-907 | Specular Reflectance Unit
The SLM-907 specular reflectance accessory measures the relative reflectance of a sample in comparison with the light reflected from an aluminum-deposited reference plane mirror.
It is typically used for the reflectance measurement of sample types such as: metal-deposited films, metal plating, and other thin films. Film thickness can be calculated using the film thickness analysis program in Spectra Manager.
· Double prism monochormator
→ Double prism monochromator providing low stray light
→ Wide dynamic range PMT detector
→ Highly efficient nitrogen purge system
→ Digital signal processing
→ Simultaneous Multi-Probe: CD, LD, HT, DC, absorbance, fluorescencePU-4180/85 RHPLC and
→ PU-4280/85 UHPLC pump models.
· Optional Accessories
→ Polarizer (GPH-506)
→ Application program (film thickness calculation program, etc.)
→ Sample stage with 2-mm-dia. port(MSK-001) - [ Minimum sample size : 3x3mm Maximum sample size : 50x50mm ]
→ Sample stage with 4-mm-dia. port(MSK-002) - [ Minimum sample size : 5x5mm Maximum sample size : 50x50mm ]
[ MSK - 001 ] [ MSK - 002 ]
2. SLM-908 | Accessory for 6-inch Silicon Wafers (V-750/760/770/780)
The SLM can be used to measure the reflectance and thickness of metal-deposited films.
The SLM-908 can measure larger samples such as 6 inch silicon wafers.